Resumen:
(Bi05Na05)(1-x)BaxTiO3, (BNBT), which exhibits compositions for the morphotropic phase boundary (MPB) where exist an intimate coexistence of the rhombohedral and tetragonal structures, is being considered as promising lead-free alternative to the well known Pb(Zr-x,Ti1-x)O-3 (PZT). In this work, BNBT thin films were fabricated by chemical solution deposition (CSD) with a wide range of compositions (x0.050-0.150) onto Pt / TiO2/ SiO2/ (100)Si substrates. Structural studies by X-ray diffraction (gimel(cu)1.5406 angstrom) using a four-circle goniometer were carried out to determine the crystalline structure of the films. Rietveld analysis of the experimental X-ray patterns showed different volume fractions of the rhombohedral and tetragonal phases as a function of the Ba2- content and the coexistence of both phases, characteristic of a MPB region, for x0.055-0.080. Finally, Rutherford backscattering experiments (RBS) were performed to determine the compositional profile of the films. This study revealed a homogenous composition of the BNBT films with abrupt film/ substrate interfaces.
