Resumen:
High-resolution electron backscattered diffraction (HR-EBSD) is a powerful tool to describe microstructures at the sub-micrometric scale that achieves a higher degree of angular accuracy compared with conventional EBSD. However, such an EBSD technique is time-consuming and requires data-intensive computing to save and postprocess the results obtained after each scan. In the current work, a simple strategy to transform conventional results into high-resolution results is put forward in an averaging statistical layout. This makes it possible to measure the misorientations more precisely and, subsequently, the geometrically necessary dislocations by lowering the typical noise generated from Hough transformation-based conventional EBSD. Different steel microstructures are analyzed in light of this strategy. The calculated dislocation densities for those microstructures are used as input values for evaluating the initial dislocation density contribution to the yield strength in a newly developed mechanical model.
